Agilent Technologies and Anite have announced the first shipments of their LTE UE protocol tester. This is the first product in a planned portfolio of 3GPP LTE R&D test products developed on Agilent's new E6620 wireless communications test set platform.
The Anite SAT LTE Protocol Tester with Development Toolset was created as part of a partnership between Agilent and Anite announced in November 2007. Believed to be a first-to-market SAT LTE Protocol Tester, it is intended for engineers working in the early protocol design of LTE mobile phones. It features a suite of development test tools presented in an integrated development environment that includes GUIs, a developer's API and development aids for rapid generation of Layer 1-3 test applications.
Agilent's new E6620A test set provides a common hardware platform and 3GPP-compliant protocol stack for building scalable test solutions across the LTE UE R&D life-cycle. As a one-box test set for LTE, it offers real-time, system-rate network emulation for L1/L2/L3 uplink and downlink via RF or digital baseband. It is designed to support MIMO and protocol conformance test, with full RF measurement capabilities.
Under the scope of this partnership, Anite and Agilent hope to provide a portfolio of solutions that address the entire UE lifecycle - from early development through production test. The test solutions will minimise the time required to design and deliver high-quality mobile devices by providing common development and test environments, as well as common reference protocol stack, network emulation and measurements across the portfolio.
More info:
